See all entries for this property (5 total)
Crystal system: orthorhombic
| Photoluminescence peak position, eV |
|---|
Starting materials: PbI2, dimethylformamide, quartz substrate, CH3NH3I (in 0.06 M 2-propanol)
Product: MAPbI3 film
Description: Deposit 1.0 M solution of PbI2 (L0279 for the perovskite precursor, Tokyo Chemical Industry Co. Ltd., Japan) in dehydrated dimethylformamide at 70 °C on a quartz substrate by spin-coating (slope 5 s, 6500 rpm, 5 s, slope 5 s). Anneal the resulting yellow film on a hot plate at 70 °C for 1 h. Dip the PbI2 film in a 0.06 M 2-propanol solution of CH3NH3I (Tokyo Chemical Industry Co., Ltd., Japan) for 40 s. Anneal the formed perovskite film on a hot plate at 70 °C for 1 h. Keep the samples in vacuum at RT for several days before the optical measurements; this process helps to reduce significantly the unreacted PbI2 and subsequently improves the quality of thin film samples.
Method: Photoluminescence
Description: PL measurements were based on a Yb:KGW regenerative amplified laser (pulse duration: ∼300 fs; repetition rate: 50−100 kHz) with 1.8 eV photoexcitation. O-PL peak emerged under strong fluences. Refer to Page 2317 paragraph 3; Figure 1. (a) O-PL.
Comment: Orthorhombic phase contribution towards PL.
See all entries for this property (5 total)
Crystal system: orthorhombic
| Photoluminescence peak position, eV |
|---|
Starting materials: PbI2, dimethylformamide, quartz substrate, CH3NH3I (in 0.06 M 2-propanol)
Product: MAPbI3 film
Description: Deposit 1.0 M solution of PbI2 (L0279 for the perovskite precursor, Tokyo Chemical Industry Co. Ltd., Japan) in dehydrated dimethylformamide at 70 °C on a quartz substrate by spin-coating (slope 5 s, 6500 rpm, 5 s, slope 5 s). Anneal the resulting yellow film on a hot plate at 70 °C for 1 h. Dip the PbI2 film in a 0.06 M 2-propanol solution of CH3NH3I (Tokyo Chemical Industry Co., Ltd., Japan) for 40 s. Anneal the formed perovskite film on a hot plate at 70 °C for 1 h. Keep the samples in vacuum at RT for several days before the optical measurements; this process helps to reduce significantly the unreacted PbI2 and subsequently improves the quality of thin film samples.
Method: Photoluminescence
Description: PL measurements were based on a Yb:KGW regenerative amplified laser (pulse duration: ∼300 fs; repetition rate: 50−100 kHz) with 1.8 eV photoexcitation. T-PL peak visible at low fluences. Refer to Page 2317 paragraph 3; Figure 1. (a) T-PL.
Comment: PL contribution due to low-temperature tetragonal phase